Device and method for measuring thickness
US7204146B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 2, 2006 |
| Grant date | Apr 17, 2007 |
| Priority date | — |
| Expiry date | Mar 2, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/0666
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A device for measuring thickness of an object has a vibration generator for generating vibrations in the object, a vibration detector for detecting vibrations generated in the object by the vibration generator and a frequency analyzer for calculating resonance frequency of the object. The vibration generator includes a light-emitting part which emits light towards the object to irradiate and to be absorbed by the object. A plurality of vibration detectors may be used and the frequency analyzer may include a sound speed analyzer for calculating speed of sound inside the object from vibrations detected by these plurality of vibration detectors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.