Apparatus and methods for the inspection of objects
US7206443B1 · kind B1 · utility
32Cited by
25References
13Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 7, 2000 |
| Grant date | Apr 17, 2007 |
| Priority date | — |
| Expiry date | Oct 7, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30141
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for inspecting objects comprising: creating a reference image for a representative object, the reference image comprising an at least partially vectorized first representation of boundaries representing the representative object; acquiring an image of an object under inspection comprising a second representation of boundaries representing the object under inspection; and comparing a location of at least some boundaries in the second representation of boundaries to a location of corresponding boundaries in the at least partially vectorized first representation of boundaries, thereby to identify defects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.