Impact analysis of metadata
US7206785B1 · kind B1 · utility
19Cited by
13References
20Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Oct 24, 2001 |
| Grant date | Apr 17, 2007 |
| Priority date | — |
| Expiry date | Apr 27, 2024 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S707/99942
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods and systems for estimating impact between metadata descriptors are provided. A software program compares a first metadata descriptor with a second metadata descriptor and determines an impact rating between the metadata descriptors. The impact rating may be used to map metadata descriptors or as an indication of how a change in one database will effect other interrelated databases.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.