Patent · US Expired

Monolithic micro-engineered mass spectrometer

US7208729B2 · kind B2 · utility

16Cited by
7References
37Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 29, 2003
Grant dateApr 24, 2007
Priority date
Expiry dateMay 15, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/0018
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A method of constructing a micro-engineered mass spectrometer from bonded silicon-on-insulator (BSOI) wafers is described with reference to a quadrupole spectrometer. The quadrupole geometry is achieved using two BSOI wafers (200), which are bonded together to form a monolithic block (410). Deep etched features and springs formed in the outer silicon layers are used to locate cylindrical metallic electrode rods (300). The precision of the assembly is determined by a combination of lithography and deep etching, and by the mechanical definition of the bonded silicon layers. Deep etched features formed in the inner silicon layers are used to define ion entrance and ion collection optics. Other features such as fluidic channels may be incorporated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.