Precision position determining method
US7209858B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 30, 2005 |
| Grant date | Apr 24, 2007 |
| Priority date | — |
| Expiry date | Sep 30, 2025 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB81C2201/0143
- WIPO fieldMicro-structural and nano-technology
- WIPO sectorChemistry
Abstract
A method for generating a surface profile of a microstructure. The profile is processed to determine positions of at least two edges and an approximate center point of the profiled surface. Segments of points on the determined profile are fit to a straight line centered at the approximate center point. A standard deviation of the fitted points is measured. The length and position of the segment are varied until a minimum standard deviation is determined and the process is repeated for segments having different lengths. The point is determined from the longest segment having a standard deviation approximately equal to the minimum standard deviation of all of the segment lengths.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.