Enhanced uniqueness for pattern recognition
US7211449B2 · kind B2 · utility
2Cited by
8References
8Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 29, 2003 |
| Grant date | May 1, 2007 |
| Priority date | — |
| Expiry date | Jun 2, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30148
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention describes a test structure with a first set of features which is a subset of product features; and a second set of features adjacent to the first set of features, the second set occupying a smaller area than the first set and the second set being similar to the first set yet being distinguishable from surrounding structures.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.