Optical measurement device
US7212285B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 19, 2004 |
| Grant date | May 1, 2007 |
| Priority date | — |
| Expiry date | May 16, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/453
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical measurement device capable of improving optical spectrum measurement accuracy without the need to structurally decrease a slit width. A diffraction grating for dispersing measurement light into respective different wavelengths is rotated in a given direction to produce diffracted light of selected wavelengths. A focusing lens converges the diffracted light to produce a converged beam. A slit control section varies the slit width at a constant scan speed to open or close the slit, thereby varying the passing bandwidth for the converged beam. A light receiving/measuring section receives the light passed through the slit, obtains a level function indicative of the power level of the received light that varies with change in optical frequency, and differentiates the level function by the scan speed to reproduce the spectrum profile of the measurement light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.