Monitoring the deposition properties of an OLED

US7214554B2 · kind B2 · utility

Assignee

• EASTMAN KODAK COMPANY · US

Inventors

• Dustin L. Winters · Webster, US
• Michele L. Ricks · Rochester, US
• Nancy J. Armstrong · Ontario, US
• Robert S. Cupello · Rochester, US

Key dates

• Filing date: Mar 18, 2004
• Grant date: May 8, 2007
• Expiry date: Jan 5, 2025

Classification

• Technology area (CPC H): Electricity
• CPC primary: H10K71/16

Abstract

A method for making an OLED device includes providing a substrate having one or more test regions and one or more device regions, moving the substrate into a least one deposition chamber for deposition of at least one organic layer, and depositing the at least one organic layer through a shadowmask selectively onto the at least one device region and at least one test region on the substrate. The method also includes measuring a property of the at least one organic layer in the at least one test region, and adjusting the deposition process in accordance with the measured property.