Multi tip clearance measurement system and method of operation

US7215129B1 · kind B1 · utility

Assignee

• General Electric Company · US

Inventors

• Emad Andarawis Andarawis · Ballston Lake, US
• Samhita Dasgupta · Niskayuna, US
• Shobhana Mani · Clifton Park, US
• Weiguo Chen · Ningbo City, CN

Key dates

• Filing date: Mar 30, 2006
• Grant date: May 8, 2007
• Expiry date: Mar 30, 2026

Classification

• Technology area (CPC F): Mechanical Engineering; Lighting; Heating
• CPC primary: F05D2260/80
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A multi tip clearance measurement system is provided. The clearance measurement system includes a sensor disposed on a first object, wherein the sensor comprises a plurality of probe tips configured to generate signals representative of a sensed parameter corresponding to a second object and a processing unit configured to evaluate the signals from subsets of the sensed parameters from the probe tips to detect an outlier probe tip and to adjust a gain, or an offset of the respective outlier probe tip for estimating the clearance between the first and second objects based upon the signals.