Method and apparatus for providing flexible modular redundancy allocation for memory built in self test of SRAM with redundancy
US7219275B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 8, 2005 |
| Grant date | May 15, 2007 |
| Priority date | — |
| Expiry date | Nov 19, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C11/41
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and apparatus for providing flexible modular redundancy allocation for memory built in self test of random access memory with redundancy. The apparatus includes a first redundancy support register that includes inputs for receiving an address of a location in memory under test and data relating to must fix repair elements. The address includes a row and column vector of the location. The first redundancy support register also includes outputs for transmitting the address and data. The apparatus also includes a second redundancy support register including inputs for receiving the address and data from the outputs of the first redundancy support register. Each of the inputs of the second redundancy support register shares a one-to-one correspondence to each of the outputs of the first redundancy support register. The apparatus further includes allocation logic for providing a modular implementation of the first redundancy support register and the second redundancy support register.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.