Patent · US Expired

Cache residency test instruction

US7222217B2 · kind B2 · utility

12Cited by
8References
28Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 27, 2003
Grant dateMay 22, 2007
Priority date
Expiry dateJun 8, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F12/0802
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A cache residency test instruction is described which, when executed by a processor unit, allows the processor unit to determine if a set of data resides in a cache memory that is communicatively coupled to the processor unit and communicate a result of the determination to software being executed on the processor unit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.