Patent · US Expired

Embedded micro computer unit (MCU) for high-speed testing using a memory emulation module and a method of testing the same

US7222282B2 · kind B2 · utility

3Cited by
8References
14Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 15, 2004
Grant dateMay 22, 2007
Priority date
Expiry dateNov 10, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2029/1806
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Provided are an embedded micro computer unit (MCU) using a memory emulation module and a method of testing the embedded MCU. The embedded MCU includes an internal memory that is connected to bus master devices for storing temporary data of the bus master devices and a test vector in a test mode, a memory controller for accessing the internal memory or an external memory when a processor core is operated, and a memory emulation module that is connected between the memory controller and the internal memory for storing the test vector in the internal memory in the test mode.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.