Patent · US Expired

Method and apparatus for sediment characterization

US7222546B2 · kind B2 · utility

6Cited by
9References
13Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 25, 2005
Grant dateMay 29, 2007
Priority date—
Expiry dateOct 25, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2001/021
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for characterizing contaminants within sediment comprising positioning a sampler in a continuous manner within the sediment, exposing the sampler to the sediment for a dwell time, retrieving the sampler, and analyzing the sampler. The sampler is exposed to the sediment for a sufficient period of time to allow at least one analyte of interest to permeate the sampler. The sampler may be analyzed using fluorescence and/or gas chromatography/mass spectrometry to determine contamination versus sampler length. The contamination versus sampler length may be converted to contamination versus depth or contamination versus horizontal position.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.