Patent · US Expired

Mapping-measurement apparatus

US7224460B2 · kind B2 · utility

4Cited by
4References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 21, 2004
Grant dateMay 29, 2007
Priority date
Expiry dateMay 9, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/117
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A mapping-measurement apparatus includes a light illumination unit, a photodetector for detecting, through an aperture, reflection light or transmission light from a sample, and adjustable scanning mirrors on the illumination and detection sides of the sample, each mirror having two independent rotational axes about which they can be independently rotated by a controller. The aperture restricts light incident on the photodetector from a predetermined portion of the sample surface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.