Patent · US Expired

En-face functional imaging using multiple wavelengths

US7224468B2 · kind B2 · utility

13Cited by
5References
21Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 20, 2003
Grant dateMay 29, 2007
Priority date
Expiry dateJan 13, 2025

Classification

  • Technology area (CPC A)Human Necessities
  • CPC primaryA61B5/0086
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Methods and apparatus for en-face imaging using multiple wavelengths are described. In general, an imaging system receives light reflected from a sample under test and distinguishes between reflected light at a first wavelength and reflected light at a second wavelength. Images at both wavelengths are collected simultaneously. En-face images are output using en-face image data corresponding to the first wavelength and en-face image data corresponding to the second wavelength.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.