Patent · US Expired

eFuse sense circuit

US7224633B1 · kind B1 · utility

26Cited by
4References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 8, 2005
Grant dateMay 29, 2007
Priority date
Expiry dateDec 8, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C17/18
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An eFuse reference cell on a chip provides a reference voltage that is greater than a maximum voltage produced by an eFuse cell having an unblown eFuse on the chip but less than a minimum voltage produced by an eFuse cell having a blown eFuse on the chip. A reference current flows through a resistor and an unblown eFuse in the eFuse reference cell, producing the reference voltage. The reference voltage is used to create a mirrored copy of the reference current in the eFuse cell. The mirrored copy of the reference current flows through an eFuse in the eFuse cell. A comparator receives the reference voltage and the voltage produced by the eFuse cell. The comparator produces an output logic level responsive to the voltage produced by the eFuse cell compared to the reference voltage.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.