Methods and apparatus for memory calibration
US7225097B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 28, 2005 |
| Grant date | May 29, 2007 |
| Priority date | — |
| Expiry date | Jul 28, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2207/2254
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In a first aspect, a first method is provided for adjusting memory system calibration. The first method includes the steps of (1) while in a first operating state, calibrating the memory system using a first amount of calibration data so that functional data may be read from and written to memory of the memory system; and (2) while in a second operating state, calibrating the memory system using a second amount of calibration data so that functional data may be read from and written to the memory, wherein the second amount of calibration data is smaller than the first amount of calibration data. Numerous other aspects are provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.