Patent · US Expired

Eye width characterization mechanism

US7225370B2 · kind B2 · utility

4Cited by
3References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 31, 2004
Grant dateMay 29, 2007
Priority date
Expiry dateMay 17, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31937
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An eye width characterization mechanism determines a pass setting of a sampling phase positioned within an eye width of received data. The sampling phase is incremented in a first direction from the pass setting until the sampling phase is outside the eye width of the received data. The sampling phase is then incremented in an opposite direction of the first direction starting again from the pass setting until the sampling phase is outside the eye width of the received data. The number of the sampling phase increments in the first direction is added to the number of the sampling phase increments in the opposite direction to characterize the eye width of the received data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.