Patent · US Expired

System and methods for improving signal/noise ratio for signal detectors

US7227128B2 · kind B2 · utility

76Cited by
6References
57Claims
0Family size

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Inventor

Key dates

Filing dateJun 30, 2005
Grant dateJun 5, 2007
Priority date
Expiry dateJul 2, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04N25/58
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and system for characterizing and quantifying various error and calibration components of signals associated with photo-detectors. By varying the detector operational parameters such as input light intensity and integration times, measured signals can be analyzed to separate out and quantify various components of the measured signals. The various components thus determined may be categorized according to their dependencies on the operational parameters. Such component characterization allows better understanding of the detector system and ways in which such system can be improved so as to yield an improved measurement result for which the detector is being utilized.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.