Product inspection system and a method for implementing same
US7227163B2 · kind B2 · utility
Inventor
Key dates
| Filing date | Jun 13, 2003 |
| Grant date | Jun 5, 2007 |
| Priority date | — |
| Expiry date | Nov 19, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/8806
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An inspection system and a method for using the inspection system, wherein the inspection system includes a collimated light source defining a source optical path, the collimated light source being operable to cause a collimated light beam to propagate along the source optical path, a sensing device defining a sensor optical path, the sensor optical path being substantially perpendicular to the source optical path, a reflecting device disposed within the source optical path to receive the collimated light beam, the reflecting device causing a reflected collimated light beam to propagate along the sensor optical path to the sensing device and a retention mount, the retention mount being disposed within the sensor optical path such that when a component is retained within the retention mount, the component blocks at least a portion of the reflected collimated light beam.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.