Optical substrate for enhanced detectability of fluorescence

US7227633B2 · kind B2 · utility

Assignee

• OC Oerlikon Balzers AG · LI

Inventors

• Jorg Kraus · Gettorf, DE
• Johannes Edlinger · Frastanz, AT
• Max Wiki · Brugg, CH
• Heidi Thome-Forster · Buchs, CH
• Claus Heine-Kempkens · Chur, CH
• Bernd Maisenhoelder · Bellinzona, CH
• Martin Kaspar · Fellbach, DE

Key dates

• Filing date: Jun 2, 2004
• Grant date: Jun 5, 2007
• Expiry date: Jun 2, 2024

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N21/0303
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A sample substrate adapted for use with fluorescence excitation light with a first wavelength. A reflector is disposed on a base. The reflector includes a reflecting multilayer interference coating with at least two layers. Not all of the layers L fulfill a quarterwave condition: dL·nL=(2N+1)·1/4 wherein dL is a physical thickness of layer L, nL is an index of refraction of layer L at the first wavelength, N is an integer equal to or greater than zero and 1 is the first wavelength. Thicknesses of the layers ensure that any fluorescent sample material disposed on top of said multilayer interference coating would be located near an antinode of a standing wave formed by the excitation light with the first wavelength incident on said substrate.