Three-dimensional statistic reconstruction of surfaces
US7227981B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 14, 2000 |
| Grant date | Jun 5, 2007 |
| Priority date | — |
| Expiry date | Jan 2, 2022 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B2090/367
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
The invention concerns a method and a system for three-dimensional reconstruction of an image representing the surface contours of at least an object (1), from at least a two-dimensional view of said object obtained by X-ray, which consists in: determining the position of the photographing source (7) in a reference repository; selecting a predefined model constituting a mean form of the object, and repeating the process until the contours of the model are such that the variations between the overhead projection rays of the contours of the two-dimensional image from the source and the model surface are minimal; selecting an orientation and a position for the model in the reference repository; then selecting a deformation of the model to modify its contours in three dimensions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.