Patent · US Expired

Method and device for the detection of surface defects on the outer wall of a transparent or translucent object

US7230229B2 · kind B2 · utility

2Cited by
4References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 24, 2003
Grant dateJun 12, 2007
Priority date
Expiry dateNov 15, 2023

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/90
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The device for detecting surface defects on the outer wall (2) of a transparent or translucent object (3), comprises:

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.