Patent · US Expired

Methods for SEM inspection of fluid containing samples

US7230242B2 · kind B2 · utility

13Cited by
41References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 1, 2003
Grant dateJun 12, 2007
Priority date
Expiry dateJan 29, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/2608
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of visualizing a sample in a wet environment including introducing a sample into a specimen enclosure in a wet environment and scanning the sample in the specimen enclosure in a scanning electron microscope, thereby visualizing the sample.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.