Precise x-ray inspection system utilizing multiple linear sensors
US7231013B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 21, 2003 |
| Grant date | Jun 12, 2007 |
| Priority date | — |
| Expiry date | Aug 24, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/044
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An x-ray inspection is provided featuring a single x-ray source and a planar array of linear sensors aligned in parallel. An article to be inspected is moved between the x-ray source and the linear sensors in a series of passes parallel to the array of linear sensors and substantially perpendicular to the long axes of the linear sensors. Alternately, the x-ray source and the sensors are moved as a unit relative to a stationary article. As a result, a transmission image of the article is captured for each of the linear sensors. These transmission images are then combined mathematically to generate a layer image for each separate conceptual layer of the article. In some embodiments, these layer images may then be interpreted in order to determine the quality of the article.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.