Patent · US Expired

Method for monitoring a thermodynamic process

US7231078B2 · kind B2 · utility

5Cited by

3References

31Claims

0Family size

Assignee

Powitec Intelligent Technologies GmbH · DE

Inventors

Franz Wintrich · Essen, DE
Volker Stephan · Gardelegen, DE

Key dates

Filing date	Feb 15, 2005
Grant date	Jun 12, 2007
Priority date	—
Expiry date	Jun 14, 2025

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/30108
WIPO fieldEnvironmental technology
WIPO sectorChemistry

Abstract

In a method for monitoring a thermodynamic process in an installation, in which image material (5) of the process is produced and the image material (5) is subjected to image evaluation, an eigen value problem approach is used, at least in large part, for automatic image evaluation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.