Apparatus and method for testing motherboard having PCI express devices
US7231560B2 · kind B2 · utility
36Cited by
5References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 10, 2004 |
| Grant date | Jun 12, 2007 |
| Priority date | — |
| Expiry date | Jul 29, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/68
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
This invention discloses a method for testing at least one physical link on a motherboard associated with an on-board PCI Express device. A test card is connected to an input/output port on the motherboard, wherein the test card has a PCI Express test device. A test pattern is transmitted from the test card to the PCI Express device and receiving a test result pattern by the test card from the PCI Express device through the physical link for testing thereof. The test result pattern is examined to determine defects of the physical link on the motherboard.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.