Patent · US Expired

Integrated circuit bond pad structures and methods of making

US7232705B2 · kind B2 · utility

46Cited by
10References
12Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 12, 2005
Grant dateJun 19, 2007
Priority date
Expiry dateAug 23, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D89/601
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A bond pad structure for an integrated circuit includes first and second active devices formed in a substrate, first and second buses above the first and second active devices, respectively, a bond pad above the first and second buses, first interconnections between the first and second active devices and the bond pad, and second interconnections between the first and second active devices and the first and second buses, respectively. The first active device may be at least one PMOS transistor, and the second active device may be at least one NMOS transistor. A guard band region may be formed in the substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.