Arrangements having IC voltage and thermal resistance designated on a per IC basis
US7233162B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 14, 2005 |
| Grant date | Jun 19, 2007 |
| Priority date | — |
| Expiry date | Jul 14, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31718
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems for testing a plurality of integrated circuits at a plurality of frequencies and voltages is disclosed. In one embodiment, a plurality of integrated circuits is tested at least once within a predetermined set of combinations of frequencies and voltages. If the integrated circuit fails testing within any combination of a frequency and voltage within the predetermined set, the integrated circuit is retested at a different predetermined set of combinations of frequencies and voltages. If the integrated circuit fails testing within any combination of a frequency and voltage within the different predetermined set, the integrated circuit is discarded.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.