Pattern matching using multiple techniques
US7233699B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 18, 2002 |
| Grant date | Jun 19, 2007 |
| Priority date | — |
| Expiry date | Jun 18, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V30/2504
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method for performing pattern matching to locate zero or more instances of a template image in a target image. An image is received by a computer from an image source, e.g., a camera. First pattern matching is performed on the image using a first pattern matching technique to determine a plurality of candidate areas. Second pattern matching is performed on each of the candidate areas using a second different pattern matching technique to generate final pattern match results. An output is generated indicating the final pattern match results. The second pattern matching may determine a second plurality of candidate areas which may be analyzed to determine the final pattern match results. The first pattern matching may use a plurality of pattern matching techniques, the results of which may be used to select a best technique from the plurality of techniques to use for the second pattern match.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.