Eddy current testing probe and eddy current testing apparatus
US7235967B2 · kind B2 · utility
7Cited by
5References
13Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 6, 2006 |
| Grant date | Jun 26, 2007 |
| Priority date | — |
| Expiry date | Jan 23, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/904
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An eddy current testing probe has a flexible substrate adapted to face to a surface of a test article, a plurality of coils which are fixed to the flexible substrate and energized one of which is capable of being changed sequentially, a pressing member for pressing the substrate toward the test article, an elastic member arranged between the substrate and the pressing member, and a movement limiting member for limiting a movement of the pressing member toward the test article.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.