Keyhole echo-planar imaging with double (T1 and T2*) contrast (DC-EPIC)
US7235972B2 · kind B2 · utility
5Cited by
4References
8Claims
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Key dates
| Filing date | May 14, 2003 |
| Grant date | Jun 26, 2007 |
| Priority date | — |
| Expiry date | May 14, 2023 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/5616
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An object is examined by detecting properties of the object at different times within a space formed by spatial frequencies. This is done such that temporally consecutive recordings are made in overlapping regions of the spatial frequency space and also in regions of the spatial frequency space that differ from one another.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.