Method and system for optimizing a selection of spectral sensitivities
US7236195B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Nov 6, 2002 |
| Grant date | Jun 26, 2007 |
| Priority date | — |
| Expiry date | Nov 6, 2022 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N1/603
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for optimizing a selection of spectral sensitivities for an imaging device includes determining a first set of spectral sensitivities from an initial set of spectral sensitivities based on an analysis of one of a universal measure of goodness, a μ-Factor, and RMS noise. A second set of spectral sensitivities is determined from the first plurality of sets of spectral sensitivities based on an analysis of a different one of the universal measure of goodness, the μ-Factor, and the RMS noise. The second set of spectral sensitivities is an optimized set of spectral sensitivities.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.