Method and apparatus for testing tunnel magnetoresistive effect element
US7236392B2 · kind B2 · utility
6Cited by
4References
10Claims
0Family size
Assignee
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Key dates
| Filing date | Apr 8, 2005 |
| Grant date | Jun 26, 2007 |
| Priority date | — |
| Expiry date | Apr 8, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5006
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Testing a TMR element includes a step of measuring initially a resistance value of the TMR element to provide the measured resistance value as a first resistance value, a step of measuring a resistance value of the TMR element after continuously feeding a current through the TMR element from a anti-substrate side to a substrate side for a predetermined period of time, to provide the measured resistance value as a second resistance value, and a step of evaluating the TMR element by comparing the first resistance value and the second resistance value with each other.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.