Full-width array sensing of two-dimensional residual mass structure to enable mitigation of specific defects

US7236711B2 · kind B2 · utility

Assignee

• Xerox Corporation · US

Inventors

• Aaron Michael Burry · Ontario, US
• Christopher A. DiRubio · Webster, US
• Gerald M. Fletcher · Pittsford, US
• Eric S. Hamby · Fairport, US
• Martin Krucinski · Webster, US
• Robert Mead · Lostwithiel, GB
• Bruce J. Parks · Fairport, US
• Peter Paul · Webster, US
• Palghat S. Ramesh · Pittsford, US
• Eliud Robles Flores · Rochester, US
• Fei Xiao · Mountain View, US

Key dates

• Filing date: Mar 31, 2005
• Grant date: Jun 26, 2007
• Expiry date: Feb 23, 2026

Classification

• Technology area (CPC G): Physics
• CPC primary: G03G2215/00059
• WIPO field: Optics
• WIPO sector: Instruments

Abstract

A defect analysis system for a xerographic print engine includes a residual mass sensor that senses the two-dimensional signature structure of residual mass remaining on a photoconductive or other substrate surface after image transfer. Preferably, the sensor is a full width array that spans substantially an entire width of the photoconductive surface. This information is then processed and analyzed to determine a specific type of transfer defect present. This may include the quantified level of defect for each detected type. The defect analysis system may also include a closed-loop control system that can adjust various xerographic process parameters using feedback based on the identification and optionally magnitude of each specific defect type. The identified print quality defect, such as mottle, streaks, point deletions, graininess, etc. can then be used to determine a customized corrective control action to be taken by the feedback control of the xerographic print engine to remedy or compensate for the defect(s).