Systems and methods for determining the velocity of ultrasonic surface skimming longitudinal waves on various materials
US7237438B1 · kind B1 · utility
6Cited by
22References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 16, 2005 |
| Grant date | Jul 3, 2007 |
| Priority date | — |
| Expiry date | Jun 23, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2632
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for determining the velocity of ultrasonic surface skimming longitudinal waves on various materials are described herein. In embodiments, a surface skimming longitudinal wave is generated at a first location on a material, at least a portion of that wave is detected at a second location on the material, the time-of-flight of that wave between the first and second locations is determined, and then the velocity of that wave is determined. One or more crystallographic orientations of the material may then be determined based upon that velocity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.