Image defect inspecting apparatus and image defect inspecting method
US7239738B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 4, 2003 |
| Grant date | Jul 3, 2007 |
| Priority date | — |
| Expiry date | Jan 26, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30144
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An image defect inspecting apparatus of the present invention includes a template image producing section for producing a template image from reference image data, a corresponding image extracting section for extracting a predetermined image located at a position corresponding to a template image from digital data of a scanned image for inspection, data embedding sections for embedding desired same pattern data into the template image and the image extracted by the corresponding image extracting section, a normalized correlation value calculation processing unit for acquiring a normalized correlation coefficient from the template image and the extracted image, into which the pattern data is embedded, and a defect judging section for judging as to whether a defect is present by comparing the normalized correlation coefficient acquired by the normalized correlation value calculation processing unit with a predetermined threshold value so as to acquire a large/small relationship thereof.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.