Parallel test system and method
US7240258B1 · kind B1 · utility
13Cited by
9References
4Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Sep 27, 2002 |
| Grant date | Jul 3, 2007 |
| Priority date | — |
| Expiry date | Apr 20, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3004
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A parallel test device for testing a DUT includes a controller that has a test procedure useful for both sequential and parallel testing, a test regimen that includes a parallel procedure, and a parallel wrapper applied to the test procedure to provide the parallel procedure; and a plurality of test instruments that test the DUT in response to the controller.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.