Patent · US Expired

Method and apparatus for detecting and determining event characteristics with reduced data collection

US7240564B2 · kind B2 · utility

3Cited by
20References
48Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 30, 2002
Grant dateJul 10, 2007
Priority date
Expiry dateJul 31, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2203/0623
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus for detecting and determining event characteristics such as, for example, the material failure of a component, in a manner which significantly reduces the amount of data collected. A sensor array, including a plurality of individual sensor elements, is coupled to a programmable logic device (PLD) configured to operate in a passive state and an active state. A triggering event is established such that the PLD records information only upon detection of the occurrence of the triggering event which causes a change in state within one or more of the plurality of sensor elements. Upon the occurrence of the triggering event, the change in state of the one or more sensor elements causes the PLD to record in memory which sensor element detected the event and at what time the event was detected. The PLD may be coupled with a computer for subsequent downloading and analysis of the acquired data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.