Probe retention kit, and system and method for probing a pattern of points on a printed circuit board
US7242203B2 · kind B2 · utility
5Cited by
3References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 13, 2004 |
| Grant date | Jul 10, 2007 |
| Priority date | — |
| Expiry date | Dec 1, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2808
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe retention kit may include a plurality of probe retention devices, each having: (i) a base; (ii) a retention mechanism, coupled to the base, for mechanically coupling a probe substrate with the plurality of probe retention devices; and (iii) solder legs to be inserted into a printed circuit board, the solder legs having opposite ends that extend through the base and provide an alignment mechanism for receiving the probe substrate. Alternative probe retention devices, and systems and methods using same, are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.