Smart spacecraft structures based on laser metrology
US7242483B2 · kind B2 · utility
2Cited by
3References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 12, 2004 |
| Grant date | Jul 10, 2007 |
| Priority date | — |
| Expiry date | Dec 10, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/16
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A laser metrology system for estimating the deformation of a structure is provided. The system includes a plurality of laser beam position detectors distributed across a surface of the structure. Each laser beam position detector is intersected by a laser beam and is configured to determine the change in location of the intersection point in at least one dimension. By determining the change in location of the intersection point for each laser beam position detector, the laser metrology system can calculate the deformation of the structure that caused these changes in location.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.