System and method for monitoring SMT apparatuses
US7243047B2 · kind B2 · utility
1Cited by
3References
19Claims
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Key dates
| Filing date | Feb 28, 2006 |
| Grant date | Jul 10, 2007 |
| Priority date | — |
| Expiry date | Feb 28, 2026 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P90/02
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A method for monitoring surface mount technology (SMT) apparatuses includes the steps of: providing a data saving module for saving attribute data on the SMT apparatuses, the attribute data including maintenance parameters, repair parameters, and defect rate parameters; obtaining dynamic data on the SMT apparatuses in real time, the dynamic data including maintenance data, repair data, and defect rate data; and monitoring the SMT apparatuses by comparing the attribute data and the dynamic data on the SMT apparatuses.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.