Downhole optical sensor system with reference
US7245382B2 · kind B2 · utility
16Cited by
4References
31Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Oct 24, 2003 |
| Grant date | Jul 17, 2007 |
| Priority date | — |
| Expiry date | Sep 26, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2290/60
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Embodiments of the present invention generally provide methods, apparatus, and systems for compensating for frequency fluctuations in source light used to interrogate an optical sensor. The optical sensor may be interrogated to generate a sensor signal. A reference device co-located with the optical sensor may also be interrogated to generate a reference signal. Optical parameters extracted from the reference signal may be used to correct parameters extracted from a sensor signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.