Method for diagnosing complex system faults
US7246271B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 23, 2003 |
| Grant date | Jul 17, 2007 |
| Priority date | — |
| Expiry date | Mar 1, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2257
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An improved method and system for diagnosing faults of a system under test is provided. One or more candidate diagnoses potentially responsible for observed testing failures are generated. Each candidate diagnosis is then assigned a weight based in part on any of a number of factors not previously considered in the weighting process, thus making the weighting process more accurate. In one case, the weight of a diagnosis may be based on the combined consistent utilization of the candidate diagnosis across all failing system tests. Alternately, or in addition, that weight may be based on the combined utilization of the diagnosis among all passing system tests. Other potential factors may also be used.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.