Method for the contactless determination of a thickness of a layer made of electrically-conductive material
US7248042B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 23, 2005 |
| Grant date | Jul 24, 2007 |
| Priority date | — |
| Expiry date | Jul 1, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/105
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
With a method for the contactless determination of a thickness of a layer (20) made of electrically-conductive material of a component (17), a sensor composed of a coil form (13) and a coil (14) is positioned in the vicinity of the component (17) to be measured. The method is based on a combination of the principles of induction and eddy current. The thickness of the layer (20) is determined using a plurality of measuring and evaluation steps in which the coil (14) is acted upon with a first alternating current frequency f1 and a second alternating current frequency f2, and its change in inductance is evaluated. The distance between the coil form (13) and, therefore, the coil (14), and the component (17) is derived from the inductance value of the coil (14) acted upon with the second alternating current frequency f2.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.