Programmable system for device testing and control
US7248986B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 23, 2004 |
| Grant date | Jul 24, 2007 |
| Priority date | — |
| Expiry date | Aug 13, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3272
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A programmable system for testing relays and controlling systems is provided. In one embodiment the present disclosure provides a programmable device capable of, for example, testing relays. The device includes a signal generator for generating signals to test relays. The device includes a memory location, and a first program stored in the memory location. The first program supports relay testing. The device includes a versioned program to support relay testing, and a processor in communication with the signal generator and the memory location. The device also includes a routine that is operable by the processor to install a versioned program in the memory location replacing the first program.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.