Patent · US Expired

Non-destructive stringer inspection apparatus and method

US7249512B2 · kind B2 · utility

45Cited by
19References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 24, 2005
Grant dateJul 31, 2007
Priority date
Expiry dateJul 28, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2291/2694
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A hat stringer inspection device permits continuous inspection of hat stringers as one or more probes are moved along the length of the hat stringer. Probes may be magnetically coupled to opposing surfaces of the structure, including, for example, where one of the probes is positioned inside the hat stringer and the probes are magnetically coupled across the surface of the hat stringer. The device may be autonomous with a feedback-controlled motor to drive the inspection device along the hat stringer. Magnetic coupling is also used to re-orient the position and/or alignment of the probes with respect to changes in the hat stringer or shapes, sizes, and configurations of hat stingers.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.