Method and apparatus for measuring effective focal spot parameters of an X-ray source
US7249886B1 · kind B1 · utility
8Cited by
5References
19Claims
0Family size
Assignee
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Key dates
| Filing date | May 30, 2006 |
| Grant date | Jul 31, 2007 |
| Priority date | — |
| Expiry date | May 30, 2026 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/037
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method for measuring focal spot shape of a radiation beam from a radiation source includes collimating the radiation beam using a collimator having a well-defined edge, measuring an intensity profile of the collimated radiation beam, determining a function of the measured intensity profile, and determining a metric of the of the focal spot using the determined function of the measured intensity profile.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.