CMOS image sensor capable of performing analog correlated double sampling
US7250897B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 29, 2005 |
| Grant date | Jul 31, 2007 |
| Priority date | — |
| Expiry date | Dec 29, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/56
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A complementary metal oxide semiconductor (CMOS) image sensor capable of performing an analog correlated double sampling method is provided. The CMOS image sensor includes an image capturing unit for capturing an analog signal corresponding to an image of a subject; an analog-digital converting unit for converting the analog signal into a digital signal by using a ramp signal decreasing in a fixed slope according to a reference clock; a ramp signal generation unit for providing the ramp signal to the analog-digital converter; and a control unit for providing said units with control signals and outputting data to the outside through an interface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.