Patent · US Expired

Circuitry for and method of improving statistical distribution of integrated circuits

US7251164B2 · kind B2 · utility

17Cited by
97References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 11, 2005
Grant dateJul 31, 2007
Priority date
Expiry dateOct 11, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2211/4016
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An integrated circuit device comprising a memory cell array including a plurality of memory cells wherein each memory cell includes at least one electrically floating body transistor having source, drain and a body regions, wherein the body region is electrically floating and disposed between the source and drain regions; a gate is disposed over the body region. Each memory cell includes a first data state representative of a first charge in the body region and a second data state representative of a second charge in the body region. The integrated circuit device further includes operating characteristics adjustment circuitry, coupled to the memory cell array, to adjust one or more operating or response characteristics of one or more memory cells to improve the uniformity of operation/response characteristics of the memory cells of the memory cell array relative to the other memory cells of the array.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.